Signal and Power Integrity in the Test Interface

Abstract:

The semiconductor test cell is a complicated environment that creates challenges for the transmission of electrical signals. The resources necessary to power and verify device functionality require large handling and testing equipment. Signals from the test equipment must travel long distances and through a variety of interfaces to reach the device. Slow speed signals with minimal loading can be sourced from a distance, however high power must be supported near the device. This requires an intelligently designed interface that pays close attention to signal and power integrity.

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