Spring Probes and Probe Cards for Wafer-Level Test

Abstract:

There are many differences between wafer probe and wafer-level test, some obvious, some subtle. There are both electrical and mechanical differences.

Electrical performance requirements dictate the use of spring probes for wafer-level test.

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ADC Test Development Tool Kit

Abstract:

This paper resents the methodology and application of an ADC signature analysis tool kit that we have developed at LTX-Credence to allow customers to not only evaluate converter performance but also the data acquisition system.

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