The Internet of Things (IoT) seems to be on a good growth trajectory. Novel sensor devices for the end nodes, combinations thereof are launched every month.
Many sensors – many of them being MEMS based – require a thorough calibration and test prior to being assembled into the end node device. Sensor test typically includes providing a defined stimulus signal – e.g. acceleration, turn, magnetic field, sound, moisture, gas – while the device is being tested not only to validate the device function but also to calibrate its output signals. Providing such a stimulus during test is no minor challenge: consider what can happen to a contacted device under test do when subjected to an acceleration as high as 100g – 10 times that what electronics in a fighter jet are typically exposed to.