Comparison of Different Methods in Determining Current Carrying Capacity of Semiconductor Test Contacts

Abstract:

As has been pointed out by various presenters at BiTS, there is no one consistent method for measuring, determining, and specifying Current Carrying Capacity (CCC) in test socket interconnects. This presentation will review existing test methods and compare advantages and disadvantages of each method.

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A Test-Cell-Solution for 81 GHz Automotive Radar ICs

Abstract:

Improving driver safety and reducing injuries from car accidents is causing dramatic growth in ADAS (Advanced Driver Assistance Systems). Short range Radar-based ADAS operated initially at 24GHz, but the 76GHz – 81GHz market share is increasing, providing better range, bandwidth and resolution for detecting objects.  Furthermore, automotive 0 ppm failure rates require full functional test of packaged ADAS ICs at-speed.

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“Taking MEMS test and calibration to the next level ” – An integrated platform approach driving further MEMS growh

Abstract:

What used to be a technology driven by high-end automotive and medical applications has become a true commodity: MEMS. Any state of the art electronic gadget – be it a mobile phone, a tablet or a camera – makes extensive use of MEMS components.

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Are New Temperature Test Strategies Needed? Meeting Performance and Cost Requirements of Today´s Applications

Abstract:

Traditionally final test of semiconductors at the full temperature range from cold (- 55°C) up to hot (+175°C) is strongly related to automotive applications.

Due to the nature of the end applications any failure would be a possible cause of most serious – even live-threatening – consequences.

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