Exploring Semiconductor Test Equipment Business Cycles

Abstract:

This article is intended to explore what drives semiconductor test equipment sales cycles. Are the cycles of the past gone forever? Are we in a period where seasonality rules the day? Are there any opportunities for sustained growth? What should companies be doing in this “new normal”?

Read more

Final Test Solution of WLCSP Devices

Abstract:

Wafer Level Chip Scale Package (WLCSP) devices are used because they offer low cost, small footprint packages to be directly mounted into smartphones, tablet PC‘s and other mobile devices and meanwhile even in automotive applications. The manufactures of these mobile and automotive application devices are demanding lower defect parts per million (DPPM) from their suppliers of WLCSP devices.

Read more