Using Distributed Test on ATE to increase throughput and lower COT at final test

Abstract:

Analog and low pin count device test cells may often use ‘turret’ style handlers, in which each stage can be configured to do a specific back-end process task in a serial manner.

Due to this serial, single flow “production line” design, a turret handler approach adds inefficiencies. The whole process only goes as fast as the slowest stage. The overall UPH decreases significantly as test time increases. The classical multisite test is non-ideal and adds a significant overhead to the process flow.

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ATPG tool for Automotive and Mixed Signal Test

Abstract:

An ATPG tool has been developed to improve productivity for automotive and mixed signal customers developing test programs using the Unison ATE programming environment. Input on feature requirements from users has helped to optimize the usefulness of the tool.

When developing mixed signal test programs, users are often pressured by time constraints to write monolithic sections of code that are poorly documented and difficult to maintain. Graphical “block structured” interfaces in commercial ATE are often perceived to slow-down the process of generating a test program and may be bypassed, losing the potential benefits of these structured templates and integrated graphical debug tools.

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Poster “Testing Challenges for IoT Smart Sensors”

Introduction:

According to many market predictions, the IoT will drive a “third wave” of semiconductor growth to enable over 25 billion sensors by 2020 for end-node applications in multiple market segments [1].  These IoT end nodes are smart, connected ‘things’ that typically consist of 3 key elements: sensors, microcontrollers (including flash memory) and low-power wireless interfaces.

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