High-Volume Manufacturing Testing of 5G Power Amplifiers

Keysight and Cohu Extend Collaboration

Cohu co-authored a press release with Keysight on the integration of Keysight’s 5G NR Signal Studio and PXI modular instruments with Cohu’s HVM radio frequency (RF) test tools (click here to read the press release). The press release highlights the collaboration of the two companies developing an integrated solution, which simplifies correlation of measurement test results between design validation and manufacturing test.

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Test Cell Innovation for Improved RF and MEMS Test Performance

Abstract:

The latest semiconductor applications continue to present test challenges which require innovative solutions to reach the required level of technical performance whilst delivering low cost of test and decreasing the time to develop and deploy test in production.

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Measurement Challenges for Over-the-Air Test of Antenna in Package (AiP) ICs

Abstract:

Over-the-Air (OTA) measurements are defined as standardized methods to evaluate performance of wireless semiconductors / transceivers / systems. In this paper, we will focus upon in-tester OTA measurement challenges in the upcoming fifth generation (5G) semiconductor designs which support the backbone of these wireless systems.

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