Cohu’s cHybrid Kelvin contactors defines a new reference for cost of test efficiency. After a successful qualification at a leading US-based analog semiconductor manufacturer, this contactor became a new standard in high volume production for small leaded and leadless devices that are commonly used in the growing mobile communications market such as smartphones, tablets and wearables.
About Daniela Klostermeier
This author has yet to write their bio.Meanwhile lets just say that we are proud Daniela Klostermeier contributed a whooping 105 entries.
Entries by Daniela Klostermeier
Cohu, with its recognized industry-leading suite of flexible and cost-effective MEMS test cell offerings, has received additional complete test cell orders from two leading global manufacturers of high-quality electronic sensors, one located in Singapore and the other in China, to address next-generation device test requirements and supplement existing production capacity.
Incredibly, the number of transistors in integrated circuits (ICs) has tracked Moore’s law, doubling every two years. Equally amazing is the recent jump in IC device operating frequency into the mmWave spectrum. The emergence of 5G, next-generation WiFi protocols, and automotive automation have pushed ICs into these extreme frequency bands to take advantage of the additional available bandwidth.
Today cmWave (3-30 GHz) and mmWave (30-300 GHz) applications have become mainstream. The wafer is becoming the new final test package. Testing automotive radar on wafer at 80 GHz and 150 degC was previously a fantasy, but is now a reality
A recognized standard for evaluating the CCC (current carrying capacity) of an interconnect used at wafer probe has been the ISMI Probe Council Current Carrying Capability Measurement Guideline, published by International SEMATECH Manufacturing Initiative in 2009.
Effective thermal management has become mandatory for testing devices with faster switching speed transistors that are increasing in numbers in smaller packages. These devices are dissipating more heat while being held at steady test temperature extremes.
New Diamondx VI1x Instrument Enables High Multi-site Automotive and Industrial Device Testing. Automotive power electronics IC’s are complex and have stringent test requirements. Typically this limits how many IC’s can be tested in parallel, and thus inhibits the cost-effectiveness of modern highly parallel manufacturing test strategies.
High Bandwidth Memory (HBM) is a new type of memory device bringing higher bandwidth, smaller form factor and lower power consumption to keep up with processor performance growth. This is achieved by stacking multiple DRAM dies onto a base controller die, which are interconnected by through-silicon vias (TSV) and micro bumps.
Cohu’s intelligent cDragon Contactor ideally supports final testing at temperature and speed Cohu’s new cDragon combines advanced test features at temperatures from -55 °C to +155 °C with best RF capabilities and an innovative pin design for highest test yield and low cost of ownership. The closed-loop Intelligent Contactor Option controls the required conditions for the […]
Keysight and Cohu Extend Collaboration Cohu co-authored a press release with Keysight on the integration of Keysight’s 5G NR Signal Studio and PXI modular instruments with Cohu’s HVM radio frequency (RF) test tools (click here to read the press release). The press release highlights the collaboration of the two companies developing an integrated solution, which […]