Keysight and Cohu Extend Collaboration Cohu co-authored a press release with Keysight on the integration of Keysight’s 5G NR Signal Studio and PXI modular instruments with Cohu’s HVM radio frequency (RF) test tools (click here to read the press release). The press release highlights the collaboration of the two companies developing an integrated solution, which […]
About Daniela Klostermeier
This author has yet to write their bio.Meanwhile lets just say that we are proud Daniela Klostermeier contributed a whooping 106 entries.
Entries by Daniela Klostermeier
The latest semiconductor applications continue to present test challenges which require innovative solutions to reach the required level of technical performance whilst delivering low cost of test and decreasing the time to develop and deploy test in production.
Over-the-Air (OTA) measurements are defined as standardized methods to evaluate performance of wireless semiconductors / transceivers / systems.
Consumer demand and competitive pressure have pushed automotive manufacturers to build greater intelligence into automobiles and trucks.
Decisions should be supported with verifiable performance data. This is true when selecting contactors, test sockets, and probe heads of test. This intent of this paper is to describe and define the data used to specify contactors, test sockets, and probe heads for test.
POWAY, Calif.–(BUSINESS WIRE)–Oct. 1, 2018– Cohu, Inc. (NASDAQ: COHU) today announced the completion of its acquisition of Xcerra Corporation. The combination creates a global leader in back-end semiconductor equipment and services, and printed circuit board test with a breadth of products that are unmatched in the industry. “The acquisition of Xcerra accelerates our strategy to diversify our product offerings and customer […]
As we follow the Long-Term Evolution (LTE) roadmap to 5G, we know for certain that 5G will be faster than 4G. Increasing speed with a need to reduce cost is motivating cell phone makers to sue Antenna in Package (AiP) ICs.
This presentation describes and defines the data used to specify contactors and test sockets, and probe heads for test. The source methodology and process for developing the lab data describing these performance specifications is reviewed.
What will drive the direction of semiconductor testing over the next 3-5 years; What does this mean for semiconductor test
This presentation/paper will take you on a journey of testing cmwave/mmWave devices in High Volume semiconductor Manufacturing (HVM). Many believe that testing high frequency devices with contacted test will be too expensive.