cBoa™ Contactor and ProbeHead

Cost-Efficient, High-Performance Contactor or ProbeHead for High-Volume Production Test

  • Key Features

    • Low loop inductance and high bandwidth
    • WLCSP, BGA, LGA, QFN, QFP
    • Singulated, strip or wafer-level test
    • High-frequency requirements
    • Pitches down to 0.3 mm
    • Variety of contact materials to optimize performance
    • Optional floating alignment plate
  • Benefits:

    • Excellent resistance stability and longer usable life
    • Superior reliability based on materials and design
    • Large compliance window to accommodate stack height tolerances for improved yields
    • Optimal DUT alignment
    • Excellent current carrying capacity