Scalable, cost-efficient solution for high-performance SerDes
The new HSI2x instrument for the well-established Diamondx ATE platform is optimized for testing clock-embedded and clock-forwarded serial interfaces commonly found in mobile, consumer, industrial and automotive electronics. These ports connect modems, cameras, displays, storage and applications processors to enable high bandwidth, low power consumption, and low EMI.
The HSI2x instrument features 32 transmit lanes and 24 receive lanes with up to 12.8 Gbps data rate. The instrument can be used for test of high-speed serial ports, such as HDMI, MIPI, JESD204, PCI Express, SATA, EDP, Vby1 and USB3.
HSI2x builds on the established Diamondx HSIO instrument and enhances the capabilities to meet the advanced test requirements. The HSI2x features true parallel clock-data recovery and bit-error-rate testing, built in PRBS pattern generation, deep user-programmable pattern memory, and flexible jitter and equalization settings.
Christopher Lemoine, Product Marketing Director, highlights: “Cohu has a long legacy of leading-edge SerDes solutions. Working closely with our customers, we have developed this new instrument to support the test needs of next generation applications processors, flat panel display drivers, display timing controllers, and other high data rate devices, with cost effectiveness that is unmatched in the ATE industry.”
To learn more about the new Diamondx instrument, please click here