Poster – Contacting Challenges for 5G


There are numerous challenges to contacting 5G devices for test. These challenges are driven by devices becoming available before the standards are ratified, evolving test methods and tester resources, trends toward devices with antenna in package (AiP), and the range of test frequencies over the cmWave bands (3 GHz to 30 GHz) and mmWave brands (30 GHz to 100 GHz). Contacting solutions for these challenges require special considerations for the full path between the DUT and tester resource rather than limiting the focus to the interconnect between DUT and PCB.

Version: March 2018
Presented by: Dan Campion
Presented at: BiTS Workshop