As application for IoT continue to expand in smart cities, home automation, connected vehicles, and health care, this has become a significant growth driver for semiconductor devices. Meeting the challenges of double digit growth in unit volumes, relentless cost pressure and the ability to address a variety of sensors are required to succeed in this technology. We introduce an advanced mass production test technique for various sensors.
Version: December 2016
Presented by: Hidenori Kakizaki
Presented at: SEMICON Japan 2016