Proposal for the sensor test process to succeed in IoT market


As application for IoT continue to expand in smart cities, home automation, connected vehicles, and health care, this has become a significant growth driver for semiconductor devices. Meeting the challenges of double digit growth in unit volumes, relentless cost pressure and the ability to address a variety of sensors are required to succeed in this technology. We introduce an advanced mass production test technique for various sensors.

Version: December 2016
Presented by: Hidenori Kakizaki
Presented at: SEMICON Japan 2016