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ADC Test Development Tool Kit

Abstract:

This paper resents the methodology and application of an ADC signature analysis tool kit that we have developed at LTX-Credence to allow customers to not only evaluate converter performance but also the data acquisition system.

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Testing High Speed, High Accuracy Analog to Digital Converters in ADC Embeeded in System-On-Chip

Abstract:

High speed, high accuracy ADC’s built on SOC IC’s tested on digital testers with round-trip-delays, must measure INL, DNL, Gain and Offset. Algorithm efficiencies and round-trip-delay sensitivity are analysed. Efficient test methods are described.

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