This paper resents the methodology and application of an ADC signature analysis tool kit that we have developed at LTX-Credence to allow customers to not only evaluate converter performance but also the data acquisition system.
https://resources.cohu.com/wp-content/uploads/2018/06/Data-Converter.jpg200200Daniela Klostermeierhttps://resources.cohu.com/wp-content/uploads/2018/10/Cohu-Logo-300x81-300x81.jpgDaniela Klostermeier2013-03-30 08:10:222018-10-29 13:09:47ADC Test Development Tool Kit
High speed, high accuracy ADC’s built on SOC IC’s tested on digital testers with round-trip-delays, must measure INL, DNL, Gain and Offset. Algorithm efficiencies and round-trip-delay sensitivity are analysed. Efficient test methods are described.
https://resources.cohu.com/wp-content/uploads/2018/06/Data-Converter.jpg200200Daniela Klostermeierhttps://resources.cohu.com/wp-content/uploads/2018/10/Cohu-Logo-300x81-300x81.jpgDaniela Klostermeier2012-03-30 14:46:452018-10-29 13:14:31Testing High Speed, High Accuracy Analog to Digital Converters in ADC Embeeded in System-On-Chip
This website is using Google Analytics. Please click here if you want to opt-out. Click here to opt-out
For opting out with your mobile device, please refer to our Privacy Statement
We won't track your info when you visit our site. But in order to comply with your preferences, we'll have to use just one tiny cookies so that you´re not asked to make this choice again.AcceptRead more