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Signal Analysis of non-Unit Test Period Data

Abstract:

Standard testing of mixed signal components is generally implemented by digitizing an integer number of cycles of a waveform, and performing an FFT (if the number of collected points is of the form 2N), or a DFT. If the signal being measured does not include an integer number of cycles of the input, and the number of collected points is of the form 2N, a weighting function must be applied to suppress unwanted artifacts created by the analysis. This paper describes a mathematical approach, using a curve-fit algorithm, which permits the extraction of data in cases where the frequency of the tested signal bears a much less restrictive relationship to the sampling frequency. The implementation of the algorithm the LTX-Credence X-Series envision (Cadence) software is described.

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Improving Power Delivery in the Test Interface

Abstract:

Power integrity is the discipline of providing clean power to the DUT by minimizing noise on the Power Delivery Network (PDN). It is quickly becoming one of the biggest challenges in test interface design. By maintaining a low impedance path from tester to DUT across all operating frequencies of the device, a constant voltage can be provided to the DUT in high di/dt environment.

 

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Signal and Power Integrity in the Test Interface

Abstract:

The semiconductor test cell is a complicated environment that creates challenges for the transmission of electrical signals. The resources necessary to power and verify device functionality require large handling and testing equipment. Signals from the test equipment must travel long distances and through a variety of interfaces to reach the device. Slow speed signals with minimal loading can be sourced from a distance, however high power must be supported near the device. This requires an intelligently designed interface that pays close attention to signal and power integrity.

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Contact Force Change as a Measure for Current Carrying Capability

Abstract:

Determination of the current carrying capacity of contact springs is usually performed by measuring the temperature increase. The upper temperature limit is set by the temperature stability of the spring and the insulation material, the current limit is set accordingly.

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